|
|
|
Worldwide contacts
CAPRES has a number of agents and distributors worldwide. If your region is not mentioned, please contact us directly.
|
 |
|
|
|
| |
|
|
|
|
| |
| |
|
 |
Contact
|
|
|
CAPRES offices:
CAPRES A/S
Diplomvej, Building 373
DK - 2800 Kgs. Lyngby
Denmark
Phone: +45 88 82 14 70
Telefax: +45 88 82 14 99
Visiting address:
CAPRES A/S
Diplomvej, Building 373
Kongens Lyngby
Driving directions (from Copenhagen Airport)
 Download DTU map
E-mails:
Company:Send mail
Sales:Send mail
Support:Send mail
|
| |
Local representatives:
|
Products:
|
|
Japan
|
ALTECH CO., LTD
2F, Sumitomo Irifune Bldg.
2-1-1 Irifune Chuo-ku
Tokyo 104-0042
JAPAN
Phone: +81 3 5542 6754
Fax: +81 3 5542 6766
Web: www.ksv.jp/capres/
Contact:
Mr. Hiroshi Sato
Mr. Koki Ito
|
M4PP
M12PP
CIPTech
microRSP
M4PP SEM Module
|
|
South Korea
|
WESTPAC INC.
E-701, 16, Deongyeong-daero
1556beon-gil, Yongtong-Gu
Suwon-Si, Gyeonggi-Do,
Korea 443-813
Phone: +82 31 273 2361
Fax: +82 31 273 2360
Web: www.westpac.co.kr
Contact:
Mr. Henry Kim
|
M4PP
M12PP
CIPTech
microRSP
M4PP SEM Module |
| Taiwan |
SCIENTEK CORP.
4F, No. 22, Taiyuen Street,
ChuPei Hsinchu Hsien
Taiwan 30288
Phone: +886 3 552 6201
Fax: +886 3 552 6230
Web: www.scientek.com.tw
Contact:
Mr. G. H. Lin
|
microRSP |
|
Germany
|
KLEINDIEK NANOTECHNIK GmbH.
Aspenhaustrasse 25
72770 Reutlingen
Germany
Phone: +49 7121 345 395-0
Fax: +49 7121 345 395-55
Web: www.nanotechnik.com
Mail: Send mail
Contact:
Dr. Bernd Volbert
|
M4PP SEM Module
|
|
Hongkong
|
TWINSON INTERNATIONAL LTD.
10. 2/F., Cheong Ning Centre
Tsuen Cheong Building
202-216 Sai lau Kok Road
Tsuen Wan
Kowloon
Hongkong
Phone: +86 21 6419 6861
Fax: +86 21 6419 3965
Contact:
Mr. Victor Huang
|
M4PP,
M12PP,
M4PP SEM Module,
CIPTech |
|
|
|
|
|
Singapore
|
Aneric Enterprise Pte. Ltd.
No. 47 Kaki Bukit Place
Singapore 416225
Singapore
Phone: +65 674 70 663
Fax: +65 674 778 92
Web: www.anericholdings.com
Contact:
Mr. Eric Ng
|
microRSP
CIPTech
|
|
|
|
|
News
|
 |
Publication
2012-06-21
Microprobe Metrology for direct Sheet Resistance and Mobility characterization.
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
