CAPRES A/S develops new technology for direct nano- and micro-scale electrical characterization of materials.

We offer a versatile Microscopic Four- and Twelve Point Probe (M4PP and M12PP) for accurate micro-scale electrical tests.

The M4PP technology and it's unique features have been integrated into state-of-the-art Automatic and Semi Automatic metrology platforms for the thin film and semiconductor industries.

The CIPTech is another unique tool from CAPRES A/S developed especially for the MRAM and Read Head industries. The CIPTech features the unique capabilities of the M12PP built into a state-of-the-art semi automatic platform.

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