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Next generation electrical probing 

 

CAPRES develops new technology for

direct nano- and micro-scale electrical

characterization of materials. 
 

 
 
 
 
 

CAPRES A/S develops new technology for direct nano- and micro-scale electrical characterization of materials.


We offer a versatile Microscopic Four- and Twelve Point Probe (M4PP and M12PP) for accurate micro-scale electrical tests.


The M4PP technology and it's unique features have been integrated into state-of-the-art Automatic and Semi Automatic metrology platforms for the thin film and semiconductor industries.


The CIPTech is another unique tool from CAPRES A/S developed especially for the MRAM and Read Head industries. The CIPTech features the unique capabilities of the M12PP built into a state-of-the-art semi automatic platform.
 

CAPRES Research Grant


For researchers who wants to take advantage of CAPRES’ Microscopic Four Point Probe technology. it is possible to apply for CAPRES Research Grant.

Please read more on web page CAPRES Research Grant.

News
Nano-scopic measurements in the semiconductor industry
2007-07-05
CAPRES A/S has together with MIC and Danchip at the Technical University of Denmark (DTU) received assurance of funding o...
CAPRES A/S | DTU, Building 373 | DK-2800 Kgs. Lyngby | Tel: +45 4525 6700 | Fax: +45 45256710 | E-mail Sales@capres.com